Design-for-testability (DFT) insertion at register-transfer-level (RTL)

ABSTRACT

Systems and techniques are described for producing a synthesized IC design that includes design-for-testability (DFT) circuitry. A register-transfer-level (RTL) representation of an IC design can be received, wherein the RTL representation includes functional logic. Next, DFT logic can be added to the RTL representation, and DFT placement guidance for placing the DFT logic can be generated. Synthesis can be performed on the RTL representation to obtain the synthesized IC design, wherein during synthesis, (1) the functional logic and the DFT logic can be placed, wherein the DFT logic is placed based on the DFT placement guidance, (2) scan chains can be inserted and placed, and (3) the DFT logic can be electrically connected with the scan chains.

TECHNICAL FIELD

This disclosure relates to integrated circuits (ICs). More specifically,this disclosure relates to techniques and systems for producing asynthesized IC design that includes design-for-testability (DFT)circuitry.

BACKGROUND Related Art

Advances in process technology and an almost unlimited appetite forconsumer electronics have fueled a rapid increase in the size andcomplexity of IC designs. The importance of testing in IC designs cannotbe over-emphasized. Indeed, it would be impossible to use IC designs inmission-critical devices and applications if IC designs had not beenthoroughly tested.

Modern IC designs usually include circuitry that is specificallydesigned for testing the IC designs. FIG. 1A illustrates an example oftest circuitry that can be included in an IC design and that can be usedto test the IC design in accordance with some embodiments describedherein. IC design 100 includes test input pins 102, test output pins104, decompression logic 106, M scan chains labeled 0 through M−1, andcompression logic 108. Of course, IC design 100 also includes functionallogic which implements the desired functionality of IC design 100, butthe functional logic has not been shown in FIG. 1A to keep the figurefree of clutter.

An Automatic Test Pattern Generation (ATPG) engine can be used togenerate a sequence of compressed test vectors which can be provided todecompression logic 106 through test input pins 102, and decompressionlogic 106 can output a sequence of uncompressed test vectors. Thesequence of uncompressed test vectors can be scanned into the M scanchains via scan chain inputs (SCI) 110. The registers in the scan chainscan supply the desired test inputs to the functional logic. Once thetest data has been scanned into the scan chains, the IC design can becycled through one or more clock cycles, and the outputs from thefunctional logic can be captured by the registers in the scan chains.Next, the captured response data (i.e., the captured outputs from thefunctional logic) can be scanned out as a sequence of response vectors,and the sequence of response vectors can be provided to compressionlogic 108 via scan chain outputs (SCO) 112. Compression logic 108 cancompress the sequence of response vectors and output a sequence ofcompressed response vectors through test output pins 104. The sequenceof compressed response vectors outputted through test output pins 104can be analyzed to determine whether or not IC design 100 is functioningas desired.

FIG. 1B illustrates a single register stage in a scan chain inaccordance with some embodiments described herein. Register stage 150includes flip-flop 152 and multiplexer 154, which can be implementedusing one or more cells. A scan chain includes a plurality of registerstages coupled in series, i.e., the output (e.g., output 164) of a givenregister stage is electrically connected with the scan-in/scan-outmultiplexer input (e.g., input 156) of the next register stage. Notethat the electrical connection between the output of a given registerstage and the scan-in/scan-out multiplexer input of the next registerstage can pass through one or more inverters and/or buffers.Additionally, the functional output and the scan output may or may notbe the same, i.e., some flip-flops may have two separate outputs: onethat is used to electrically connect with the functional logic, and onethat is used to electrically connect with the multiplexor input of thenext register stage in a scan chain. Input 156 of multiplexer 154 canreceive scan-in data from decompression logic 106 (when register stage150 is the first register stage in the scan chain) or scan-in/scan-outdata from the previous register stage in the scan chain. Output 164 canprovide scan-in/scan-out data to the next register stage in the scanchain or scan-out data to compression logic 108 (when register stage 150is the last register stage in the scan chain). Multiplexer select input160 can be used to couple either input 156 or input 158 with output 162.Specifically, input 156 is coupled with output 162 when data is beingscanned into the scan chain or is being scanned out of the scan chain.On the other hand, input 158 is coupled with output 162 when flip-flop152 is being used in the normal functional mode or to capture the testresponse from the functional logic.

The test circuitry (e.g., decompression logic, compression logic, scanchains, etc.) in an IC design is not an insignificant part of the ICdesign, e.g., test circuitry can sometimes occupy up to 10% of the totalarea of an IC design. Existing IC design tools and IC design flows thatproduce IC designs that include test circuitry can have long runtimesand/or poor quality of results (QoR).

SUMMARY

Some embodiments described herein provide techniques and systems forproducing a synthesized IC design that includes DFT circuitry. Duringoperation, the embodiments can receive a register-transfer-level (RTL)representation of the IC design. Next, the embodiments can add DFT logicto the RTL representation, and generate DFT placement guidance forplacing the DFT logic. The embodiments can then perform synthesis on theRTL representation to obtain the synthesized IC design. Specifically,performing synthesis on the RTL representation can comprise performing aset of operations that include: (1) placing the functional logic and theDFT logic, wherein the DFT logic is placed based on the DFT placementguidance, (2) inserting and placing scan chains, and (3) electricallyconnecting the DFT logic with the scan chains.

Embodiments described herein have faster runtimes and/or produce betterQoR when compared to existing approaches because, among other things,the embodiments add the DFT logic to the RTL representation prior toplacement, and then place the DFT logic based on the DFT placementguidance. Additionally, because the DFT logic is added to the RTLrepresentation, the synthesis tool is aware of the power intent relatedto the DFT logic during synthesis. As a result, the placement of the DFTlogic is consistent with the power intent for the IC design, whichresults in improved QoR.

In some embodiments, electrically connecting the DFT logic with the scanchains can comprise: (1) electrically connecting outputs ofdecompression logic with inputs of the scan chains, and (2) electricallyconnecting outputs of the scan chains with inputs of compression logic.

In some embodiments, prior to adding the DFT logic to the RTLrepresentation, the RTL representation does not include any DFT logicand also does not include any scan chains (i.e., the flip-flops in thefunctional logic that will eventually form the scan chains are notelectrically connected in a series fashion in the RTL representation).

In some embodiments, prior to performing synthesis on the RTLrepresentation, the RTL representation does not include physicallocation information for the functional logic or the DFT logic.

In some embodiments, generating the DFT placement guidance for placingthe DFT logic can comprise: (1) adding a set of anchor points to the ICdesign, and (2) electrically connecting the DFT logic with the set ofanchor points. In some embodiments, each anchor point can be a dummycell having zero area.

In some embodiments, after placing the functional logic and the DFTlogic, but prior to inserting and placing scan chains, the embodimentscan (1) electrically disconnect the DFT logic from the set of anchorpoints, and (2) remove the set of anchor points from the IC design.

BRIEF DESCRIPTION OF THE FIGURES

FIG. 1A illustrates an example of test circuitry that can be included inan IC design and that can be used to test the IC design in accordancewith some embodiments described herein.

FIG. 1B illustrates a single register stage in a scan chain inaccordance with some embodiments described herein.

FIG. 2 illustrates a process for producing a synthesized IC design thatincludes DFT circuitry in accordance with some embodiments describedherein.

FIG. 3A illustrates an RTL representation after DFT logic has been addedin accordance with some embodiments described herein.

FIG. 3B illustrates a physical view after an initial placement operationis performed on the RTL representation in accordance with someembodiments described herein.

FIG. 4 illustrates a physical view after synthesis in accordance withsome embodiments described herein.

FIGS. 5A-5D illustrate different techniques by which DFT placementguidance can be generated and provided to a placer in accordance withsome embodiments described herein.

FIG. 6 illustrates an IC design system in accordance with someembodiments described herein.

DETAILED DESCRIPTION

The following description is presented to enable any person skilled inthe art to make and use the invention, and is provided in the context ofa particular application and its requirements. Various modifications tothe disclosed embodiments will be readily apparent to those skilled inthe art, and the general principles defined herein may be applied toother embodiments and applications without departing from the spirit andscope of the present invention. Thus, the present invention is notlimited to the embodiments shown, but is to be accorded the widest scopeconsistent with the principles and features disclosed herein.

Overview of IC Design and Manufacturing

IC design software tools can be used to create an IC design. Once the ICdesign is finalized, it can undergo fabrication, packaging, and assemblyto produce IC chips. The overall IC design and manufacturing process caninvolve multiple entities, e.g., one company may create the software fordesigning ICs, another company may use the software to create the ICdesign, and yet another company may manufacture IC chips based on the ICdesign. An IC design flow can include multiple steps, and each step caninvolve using one or more IC design software tools. An improvement toone or more of these steps in the IC design flow results in animprovement to the overall IC design and manufacturing process.Specifically, the improved IC design and manufacturing process canproduce IC chips with a shorter time-to-market (TTM) and/or higherquality of results (QoR). Some examples of IC design steps and theassociated software tools are described below. These examples are forillustrative purposes only and are not intended to limit the embodimentsto the forms disclosed.

Some IC design software tools enable IC designers to describe thefunctionality that the IC designers want to implement. These tools alsoenable IC designers to perform what-if planning to refine functionality,check costs, etc. During logic design and functional verification, thehardware description language (HDL), e.g., SystemVerilog, code can bewritten and the design can be checked for functional accuracy, e.g., thedesign can be checked to ensure that it produces the correct outputs.

During synthesis and design for test, the HDL code can be translated toa netlist using one or more IC design software tools. Further, thenetlist can be optimized for the target technology, and tests can bedesigned and implemented to check the finished chips. Some embodimentsdescribed herein can be used in this stage, i.e., during synthesis anddesign for test. During netlist verification, the netlist can be checkedfor compliance with timing constraints and for correspondence with theHDL code.

During design planning, an overall floorplan for the chip can beconstructed and analyzed for timing and top-level routing. Duringphysical implementation, circuit elements can be positioned in thelayout and can be electrically connected.

During analysis and extraction, the IC design's functionality can beverified at a transistor level and parasitics can be extracted. Duringphysical verification, the design can be checked to ensure correctnessfor manufacturing, electrical issues, lithographic issues, andcircuitry.

During resolution enhancement, geometric manipulations can be performedon the layout to improve manufacturability of the design. During maskdata preparation, the design can be “taped-out” to produce masks whichare used during fabrication.

DFT Insertion at RTL

As explained with reference to FIGS. 1A and 1B, the test circuitry in anIC design can include scan chains and other test circuitry (e.g., theother circuitry can include decompression logic, compression logic,circuitry to provide a test clock signal to the scan chain registers,etc.). In this disclosure, the term “DFT logic” refers to thedecompression logic (e.g., decompression logic 106 shown in FIG. 1A) andthe compression logic (e.g., compression logic 108 shown in FIG. 1A). Inthis disclosure, the term “scan chain” (e.g., any one of the scan chainslabeled 0 through M−1 in FIG. 1A) refers to a series coupling between aplurality of register stages (e.g., register stage 150 shown in FIG.1B). Note that the functional logic may already include the flip-flopsthat will eventually form the scan chains, e.g., flip-flop 152 shown inFIG. 1B. A scan chain is created when the flip-flops in the IC designare electrically coupled in series as explained with reference to FIG.1B. In this disclosure, the term “functional logic” refers to thecircuitry in the IC design that performs the functions and/orcomputations that the IC design is intended to perform. For example,functional logic can include combinational logic, sequential logic(which can include the flip-flops that will form the scan chains), clocktrees, etc. However, the term “functional logic,” as it is used in thisdisclosure, does not include DFT logic and also does not include scanchains. For example, in FIG. 1B, flip-flop 152 can be part of thefunctional logic. However, multiplexor 154 and the electricalconnections that couple the flip-flops in series are not part of thefunctional logic.

FIG. 2 illustrates a process for producing a synthesized IC design thatincludes DFT circuitry in accordance with some embodiments describedherein. The process can begin by receiving an RTL representation of theIC design (step 202). RTL is an abstraction level that describes an ICdesign in terms of the flow of data signals between registers, and thelogical operations performed on those data signals. The phrase “registertransfer level” refers to the fact that an RTL representation focuses ondescribing the “transfer” of data signals between “registers.” In someembodiments, the RTL representation received in operation 202 includesfunctional logic, but does not include DFT logic and also does notinclude scan chains.

An IC design can be represented using different data formats orlanguages as the IC design progresses through an IC design flow, whereinthe different data formats or languages represent the IC design atdifferent levels of abstraction. In general, higher levels ofabstraction contain fewer details of the IC design when compared withlower levels of abstraction. Typically, the IC design is described at ahigh level of abstraction in the early stages of the IC design flow, andthe level of abstraction becomes progressively lower as the IC designmoves through the IC design flow.

For example, toward the beginning of the IC design flow, an IC designcan be described at a high level of abstraction by using an HDL whichdescribes the functionality of the IC design. Next, the HDL can beconverted into an RTL representation by using a process calledelaboration. The RTL representation implements the functionality thatwas described in the HDL code by using logic gates (e.g., AND gates, ORgates, etc.) and registers. The HDL and RTL representations containlogical information but usually do not contain physical information,e.g., information about the placement of the gates, the areas of thegates, the leakage power, the width and lengths of the physical wiresthat electrically connect the gates and registers, or the geometricshapes that will be printed on the wafer.

As the IC design progresses through the IC design flow, these pieces ofinformation—placement, power, area, timing, routing information, actualgeometric shapes, etc.—are added to the representation. Toward the endof the IC design flow, the IC design can be represented in a low levelof abstraction by using a data format or language such as GDSII orOASIS, which provides detailed information of the actual geometricshapes that are to be printed on the wafer.

Referring back to FIG. 2, the process can add DFT logic to the RTLrepresentation (step 204). FIG. 3A illustrates an RTL representationafter DFT logic has been added in accordance with some embodimentsdescribed herein. Before step 204, RTL representation includedfunctional logic 302 only. In step 204, the process added DFT logic 304,thereby producing RTL representation 300. When DFT logic is added instep 204, the DFT logic is electrically connected to the test input andoutput pins because these pins exist in the IC design, but the DFT logicis not electrically connected to the scan chain inputs and outputsbecause the scan chains do not exist in the IC design yet (specifically,the flip-flops that will eventually form the scan chains may alreadyexist in the IC design, but the scan chains will be inserted or createdlater during synthesis by electrically connecting the flip-flops inseries).

If placement is performed after step 204 without providing any DFTplacement guidance to the placer, then the placer will not know how toproperly place the DFT logic in the circuit. This is because the DFTlogic is not electrically connected to the scan chains. For example, theplacer may clump the DFT logic near the test input and output pins,which is not the ideal placement for the DFT logic. For example, FIG. 3Billustrates a physical view after an initial placement operation isperformed on the RTL representation in accordance with some embodimentsdescribed herein. In physical view 350, the small rectangles representregisters, e.g., registers 352, in the functional logic after initialplacement is performed. Note that the placer clumped DFT logic 356 neartest I/O pins 354. This is why, in step 206, the process generates DFTplacement guidance for placing the DFT logic. Note that it is notadvisable to create scan chains and electrically connect the DFTcircuitry to the scan chains in the RTL representation because the RTLrepresentation does not contain placement information. Creating scanchains by electrically connecting the flip-flops in series andelectrically connecting the DFT circuitry to the scan chains withoutknowing where the scan chain flip-flops will be located can createserious placement, routing, and/or timing convergence problems duringsynthesis.

As mentioned above, the functionality of an IC can be specified by usingHDL code. In this disclosure, the term “elaboration” refers to a processof constructing a network of logic gates (or “gates” for short) andregisters that implements the functionality specified in the HDL code(this network of gates and registers is the RTL representation). At alater point in the IC design flow, each gate in the elaborated IC design(i.e., each gate in the RTL representation) is implemented using a cellor a network of cells which performs the logical function of the gate. Alogic gate (or a “gate” for short) is an abstract model of a circuit ina manufactured IC that performs a logical operation or a logicalfunction (e.g., “AND,” “OR,” “XOR,” “4-to-1 multiplexer,” etc.). Thecharacteristics of the actual physical circuit that is being modeled bythe gate, e.g., the power consumption (e.g., leakage power and dynamicpower), the speed (e.g., delay and transition behavior), the size (e.g.,area), etc., are determined by the cell that is used for implementingthe gate.

An IC design can be manufactured using different semiconductormanufacturing technologies, and each semiconductor manufacturingtechnology can correspond to one or more cell libraries that can be usedby an IC design software tool. Each cell in a cell library containsinformation related to a circuit that can be manufactured using thecorresponding semiconductor manufacturing technology. For example, thecell can include the layout information which specifies the physicallocation and the connectivity among different parts (e.g., gate, drain,source, etc.) of a circuit. The cell can also include information aboutthe electrical characteristics, such as the power consumption, speed,and size (i.e., area) of the circuit.

In this disclosure, the terms “placing,” “placement,” etc. refer to aprocess that assigns locations to circuit elements in an IC design, andthe term “placer” refers to an IC design tool that places circuitelements in an IC design. A placer can try to optimize one or morecriteria while placing the circuit elements. For example, a placer maytry to minimize the total wire length of the IC design (the total wirelength is the sum of the estimated lengths of the electrical connectionsbetween different circuit elements in an IC design). How the placermoves through the IC design search space can be influenced by providingthe placer with placement guidance. For example, one way to provideplacement guidance is by (1) creating dummy circuit elements in the ICdesign, (2) placing the dummy circuit elements at random orpre-determined locations in the IC design, and (3) creating electricalconnections between the actual circuit elements in the IC design and thedummy circuit elements. When the placer tries to minimize the total wirelength, the existence of the electrical connections between the actualcircuit elements and the dummy circuit elements can change how thecircuit elements are placed by the placer. Another example of placementguidance is to provide a bounding box to the placer where the placer isconstrained to place certain circuit elements.

In this disclosure, the term “synthesis” refers to a process thatconverts an RTL representation into a lower level representation (whichis sometimes referred to as the “physical design”) that includeslocation information for the gates and registers, and may also includeinformation about other physical characteristics (e.g., area, delay,leakage power, etc.) for the gates and registers. In this disclosure,the term “physical view” refers to a view of the IC design after aplacement operation has been performed, i.e., a physical view is a viewof the IC design in which the circuit elements have been assigned alocation (which may be an initial location, a tentative location, or afinal location) in the IC design.

Note that, at the end of step 206, the process has not placed the gatesand the registers that are described in the RTL representation. In otherwords, at this point in the process, the RTL representation describesthe electrical interconnections between the logic gates and theregisters, but does not include physical location information for thelogic gates or registers.

Next, the process can perform synthesis on the RTL representation toobtain a synthesized IC design (step 208). Specifically, performingsynthesis on the RTL representation can comprise performing a set ofoperations, which can include: placing the functional logic and the DFTlogic, wherein the DFT logic is placed based on the DFT placementguidance (step 208-1), inserting and placing scan chains (step 208-2),and electrically connecting the DFT logic with the scan chains (step208-3). The terms “inserting scan chains” and “creating scan chains” areused interchangeably in this disclosure. Inserting scan chains involveselectrically connecting flip-flops in the IC design in a series fashionto form the scan chains. As mentioned above, the flip-flops that formthe scan chains are part of the functional logic, and are placed in step208-1. However, during scan chain insertion, the synthesis tool mayinsert additional logic into the IC design (e.g., the additional logiccan include lockup/synchronization latches/flip-flops,multi-voltage/isolation cells, etc.). This scan-chain-specificadditional logic is placed in step 208-2. FIG. 4 illustrates a physicalview after synthesis in accordance with some embodiments describedherein. In particular, physical view 400 shows the synthesized IC designafter step 208 has been completed. Note that the DFT logic (which isshown by multiple logic clouds) is spread across physical view 400, andis now electrically connected to the scan chain registers, e.g., scanchain registers 404. Note that the DFT logic is not clumped near testI/O pins 402 because the DFT logic was placed based on DFT placementguidance. DFT placement guidance can be generated and provided to theplacer using many techniques, and some of these techniques are describedbelow.

DFT Placement Guidance

FIGS. 5A-5D illustrate different techniques by which DFT placementguidance can be generated and provided to a placer in accordance withsome embodiments described herein. In FIGS. 5A-5D, the solid rectanglesrepresent registers in the functional logic. Some or all of theseregisters will be used to form the scan chains during scan chaininsertion.

In the approach shown in FIG. 5A, DFT logic is electrically connected torandomly selected registers in the functional logic, e.g., registers 504in the functional logic. For example, each output of the decompressorcan be electrically connected to an input of a randomly selectedregister in the functional logic; likewise, each input of the compressorcan be electrically connected to an output of a randomly selectedregister in the functional logic. Next, the functional logic and the DFTlogic can be placed (i.e., step 208-1 can be performed). Because the DFTlogic was electrically connected to randomly selected registers, theplacer is likely to spread the DFT logic out (illustrated in FIG. 5A bythe three logic clouds) across physical view 500 instead of clumping theDFT logic near the test I/O pins 502. After the initial placementoperation (i.e., step 208-1) has been performed, (1) the DFT logic canbe disconnected from the registers, and (2) steps 208-2 and 208-3 can beperformed.

In the approach shown in FIG. 5B, a dummy circuit element 514 (e.g., adummy macro) is added to the IC design, and the DFT logic iselectrically connected to dummy circuit element 514. Dummy circuitelement 514 can generally be located at any desired location in the ICdesign, e.g., dummy circuit element 514 can be located in the center ofthe IC design area. The location of dummy circuit element 514 can befixed before initial placement (i.e., step 208-1) is performed. Next,the functional logic and the DFT logic can be placed (i.e., step 208-1can be performed). Because the DFT logic is electrically connected todummy circuit element 514 that has a fixed location, the placer islikely to spread the DFT logic out (illustrated in FIG. 5B by the singlelogic cloud) between the test I/O pins 512 and dummy circuit element514, instead of clumping it together near test I/O pins 512. After theinitial placement operation (i.e., step 208-1) has been performed, (1)the DFT logic can be disconnected from dummy circuit element 514, (2)dummy circuit element 514 can be removed from the IC design, and (3)steps 208-2 and 208-3 can be performed.

In the approach shown in FIG. 5C, a set of anchor points (e.g., anchorpoints 524 which are illustrated using unshaded rectangles) are createdin the IC design. An anchor point can generally be any circuit elementthat can be created in the IC design and that can be electricallyconnected to DFT logic. For example, each anchor point can be a zeroarea dummy cell that is created solely for the purpose of providingplacement guidance to the placer for placing DFT logic. Once the anchorpoints have been created, the anchor points can be spread out throughoutthe IC design area. Note that the locations of the anchors points arefixed and will not be changed by the placer. In some embodiments, theanchor points can be spread out in a regular pattern throughout the ICdesign area. In some embodiments, the anchor points can be spread out ina randomized pattern throughout the IC design area. In some embodiments,the user can provide the locations of some or all of the anchor pointsin the IC design area. Once the anchor points have been spread out, theDFT logic can be electrically connected to the anchor points. Forexample, each distinct output of the decompressor can be electricallyconnected to a distinct anchor point; likewise, each distinct input ofthe compressor can be electrically connected to a distinct anchor point.Next, the functional logic and the DFT logic can be placed (i.e., step208-1 can be performed). Because the DFT logic was electricallyconnected to the anchor points, the placer is likely to spread the DFTlogic out (illustrated in FIG. 5C by the three logic clouds) instead ofclumping it together near the test I/O pins 522. After the initialplacement operation (i.e., step 208-1) has been performed, (1) the DFTlogic can be disconnected from the anchor points 524, (2) the anchorpoints 524 can be removed from the IC design, and (3) steps 208-2 and208-3 can be performed.

In the approach shown in FIG. 5D, bounding box 534 is created forplacing the DFT logic. Bounding box 534 specifies a region in the ICdesign area where the placer is constrained to place the DFT logic.Next, the functional logic and the DFT logic can be placed (i.e., step208-1 can be performed). Because the DFT logic was constrained to beplaced in bounding box 534, the DFT logic (illustrated in FIG. 5D by thesingle logic cloud) is not clumped together near test I/O pins 532.After the initial placement operation (i.e., step 208-1) has beenperformed, (1) bounding box 534 can be removed, and (2) steps 208-2 and208-3 can be performed.

Experimental results have shown that, in general, the approach forgenerating DFT placement guidance illustrated in FIG. 5C producessynthesized IC designs that have a better QoR than those that areproduced by other approaches. However, it will be appreciated by apractitioner that it is possible for the other approaches to producebetter QoR for specific IC designs.

IC Design System

The term “IC design system” generally refers to a hardware-based systemthat facilitates designing ICs. FIG. 6 illustrates an IC design systemin accordance with some embodiments described herein. IC design system602 can include processor 604, memory 606, and storage device 608.Specifically, memory locations in memory 606 can be addressable byprocessor 604, thereby enabling processor 604 to access (e.g., viaload/store instructions) and manipulate (e.g., via logical/floatingpoint/arithmetic instructions) the data stored in memory 606. IC designsystem 602 can be coupled to display device 614, keyboard 610, andpointing device 612. Storage device 608 can store operating system 616,IC design tool 618, and data 620. Data 620 can include input required byIC design tool 618 and/or output generated by IC design tool 618.

IC design system 602 may automatically (or with user help) perform oneor more operations that are implicitly or explicitly described in thisdisclosure. Specifically, IC design system 602 can load IC design tool618 into memory 606, and IC design tool 618 can then be used to producea synthesized IC design that includes DFT circuitry.

The above description is presented to enable any person skilled in theart to make and use the embodiments. Various modifications to thedisclosed embodiments will be readily apparent to those skilled in theart, and the general principles defined herein are applicable to otherembodiments and applications without departing from the spirit and scopeof the present disclosure. Thus, the present invention is not limited tothe embodiments shown, but is to be accorded the widest scope consistentwith the principles and features disclosed herein.

The data structures and code described in this disclosure can bepartially or fully stored on a computer-readable storage medium and/or ahardware module and/or hardware apparatus. A computer-readable storagemedium includes, but is not limited to, volatile memory, non-volatilememory, magnetic and optical storage devices such as disk drives,magnetic tape, CDs (compact discs), DVDs (digital versatile discs ordigital video discs), or other media, now known or later developed, thatare capable of storing code and/or data. Hardware modules or apparatusesdescribed in this disclosure include, but are not limited to,application-specific integrated circuits (ASICs), field-programmablegate arrays (FPGAs), dedicated or shared processors, and/or otherhardware modules or apparatuses now known or later developed.

The methods and processes described in this disclosure can be partiallyor fully embodied as code and/or data stored in a computer-readablestorage medium or device, so that when a computer system reads andexecutes the code and/or data, the computer system performs theassociated methods and processes. The methods and processes can also bepartially or fully embodied in hardware modules or apparatuses, so thatwhen the hardware modules or apparatuses are activated, they perform theassociated methods and processes. Note that the methods and processescan be embodied using a combination of code, data, and hardware modulesor apparatuses.

The foregoing descriptions of embodiments of the present invention havebeen presented only for purposes of illustration and description. Theyare not intended to be exhaustive or to limit the present invention tothe forms disclosed. Accordingly, many modifications and variations willbe apparent to practitioners skilled in the art. Additionally, the abovedisclosure is not intended to limit the present invention. The scope ofthe present invention is defined by the appended claims.

What is claimed is:
 1. A non-transitory computer-readable storage mediumstoring instructions for an integrated circuit (IC) design tool that,when executed by a computer, cause the computer to perform a method forproducing a synthesized IC design that includes design-for-testability(DFT) circuitry, the method comprising: receiving aregister-transfer-level (RTL) representation of an IC design thatincludes functional logic; adding DFT logic to the RTL representation;adding a set of anchor points to the RTL representation; electricallyconnecting the DFT logic with the set of anchor points; and performingsynthesis on the RTL representation to obtain the synthesized IC design,wherein said performing synthesis on the RTL representation comprisesperforming a set of operations, the set of operations including: placingthe functional logic and the DFT logic, electrically disconnecting theDFT logic from the set of anchor points, removing the set of anchorpoints, inserting and placing scan chains, and electrically connectingthe DFT logic with the scan chains; and wherein adding the DFT logic tothe RTL representation, and placing the DFT logic based on the set ofanchor points improves a runtime of the IC design tool and/or a qualityof results (QoR) produced by the IC design tool.
 2. The non-transitorycomputer-readable storage medium of claim 1, wherein each anchor pointin the set of anchor points is a dummy cell having zero area.
 3. Thenon-transitory computer-readable storage medium of claim 1, whereinprior to said adding the DFT logic to the RTL representation, the RTLrepresentation does not include any DFT logic and also does not includeany scan chains.
 4. The non-transitory computer-readable storage mediumof claim 1, wherein prior to said performing synthesis on the RTLrepresentation, the RTL representation does not include physicallocation information for the functional logic or the DFT logic.
 5. Thenon-transitory computer-readable storage medium of claim 1, wherein saidelectrically connecting the DFT logic with the scan chains comprises:electrically connecting outputs of decompression logic with inputs ofthe scan chains; and electrically connecting outputs of the scan chainswith inputs of compression logic.
 6. A method for producing asynthesized integrated circuit (IC) design that includesdesign-for-testability (DFT) circuitry, the method comprising: an ICdesign tool in a computer receiving a register-transfer-level (RTL)representation of an IC design that includes functional logic; the ICdesign tool in the computer adding DFT logic to the RTL representation;adding a set of anchor points to the RTL representation; electricallyconnecting the DFT logic with the set of anchor points; and the ICdesign tool in the computer performing synthesis on the RTLrepresentation to obtain the synthesized IC design, wherein saidperforming synthesis on the RTL representation comprises performing aset of operations, the set of operations including: placing thefunctional logic and the DFT logic, electrically disconnecting the DFTlogic from the set of anchor points, removing the set of anchor points,inserting and placing scan chains, and electrically connecting the DFTlogic with the scan chains; and wherein adding the DFT logic to the RTLrepresentation, and placing the DFT logic based on the set of anchorpoints improves a runtime of the IC design tool and/or a quality ofresults (QoR) produced by the IC design tool.
 7. The method of claim 6,wherein each anchor point in the set of anchor points is a dummy cellhaving zero area.
 8. The method of claim 6, wherein prior to said addingthe DFT logic to the RTL representation, the RTL representation does notinclude any DFT logic and also does not include any scan chains.
 9. Themethod of claim 6, wherein prior to said performing synthesis on the RTLrepresentation, the RTL representation does not include physicallocation information for the functional logic or the DFT logic.
 10. Themethod of claim 6, wherein said electrically connecting the DFT logicwith the scan chains comprises: electrically connecting outputs ofdecompression logic with inputs of the scan chains; and electricallyconnecting outputs of the scan chains with inputs of compression logic.11. An apparatus, comprising: a processor; and a non-transitorycomputer-readable storage medium storing instructions for an integratedcircuit (IC) design tool that, when executed by the processor, cause theapparatus to perform a method for producing a synthesized IC design thatincludes design-for-testability (DFT) circuitry, the method comprising:receiving a register-transfer-level (RTL) representation of an IC designthat includes functional logic; adding DFT logic to the RTLrepresentation; adding a set of anchor points to the RTL representation;electrically connecting the DFT logic with the set of anchor points; andperforming synthesis on the RTL representation to obtain the synthesizedIC design, wherein said performing synthesis on the RTL representationcomprises performing a set of operations, the set of operationsincluding: placing the functional logic and the DFT logic, electricallydisconnecting the DFT logic from the set of anchor points, removing theset of anchor points, inserting and placing scan chains, andelectrically connecting the DFT logic with the scan chains; and whereinadding the DFT logic to the RTL representation, and placing the DFTlogic based on the set of anchor points improves a runtime of the ICdesign tool and/or a quality of results (QoR) produced by the IC designtool.
 12. The apparatus of claim 11, wherein prior to said adding theDFT logic to the RTL representation, the RTL representation does notinclude any DFT logic and also does not include any scan chains.
 13. Theapparatus of claim 11, wherein prior to said performing synthesis on theRTL representation, the RTL representation does not include physicallocation information for the functional logic or the DFT logic.
 14. Theapparatus of claim 11, wherein said electrically connecting the DFTlogic with the scan chains comprises: electrically connecting outputs ofdecompression logic with inputs of the scan chains; and electricallyconnecting outputs of the scan chains with inputs of compression logic.